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| Definition Of: | ||
Test Pads
Contact points on TAB tape, located outside the OLB window, that are used to facilitate testing and burn-in of the IC while it is in the TAB frame. Test pads remain with the discarded portion of the carrier after excising.
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Dictionary of Electronics Terminology INDEX:List of Terms: Terms beginning with "A", Page 1 |
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Page Number:
1 A: Page 1 of 1. |
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